TEMPERATURE STABILITY OF FERRITE SUBSTRATES IN MICROWAVE INTEGRATED CIRCUITS.
Abstract
With the increasing use of ferrites in microwave integrated circuits, it becomes important to determine the temperature stability of the effective values of dieelectric constant and unmagnetized permeability of ferrites in this application. This paper reports the results of such measurements on several ferrites. The test samples were slabs 2 x 0.5 x 0.032 inches. In order to provide a basis for understanding the intrinsic properties of the ferrites, the slabs were tested first by completely copper plating the sample except for an iris at eeach end. The resonant frequencies of the samples were measured at room temperature and at an elevated temperature, first without a bias field, then with a bias field. From the measurements, data was obtained on the intrinsic dielectric constant and unmagnetized permeability, and their temperature coefficients. Formulas are given to calculate the effective values from the intrinsic values. The original plating was then removed and the sample replated as a microstrip line. The magnetic filling factor was obtained from measurements on the microstrip line. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1970
- Accession Number
- AD0709597
Entities
People
- Isidore Bady
Organizations
- Atmospheric Sciences Laboratory