FIELD ION MICROSCOPY

Abstract

The basic physical effects used in field ion microscopy are not yet fully understood. Field evaporation rates of tungsten were measured in the range from 0.01 to 10,000,000 atomic layers/sec, yielding the polarizability of a kink site surface atom, the activation energy and the pre-exponential of the field evaporation equation. Using the polarizability, the dipole-dipole binding energy of field-adsorbed noble gases ahs been calculated, and a modified mechanism of field ionization and image interpretation is proposed. A high-voltage field ion microscope has been operated at up to 45 kV, giving an increased field of view.

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Document Details

Document Type
Technical Report
Publication Date
Aug 03, 1970
Accession Number
AD0709985

Entities

People

  • Erwin W. Mueller

Organizations

  • Pennsylvania State University

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Adsorption
  • Atomic Structure
  • Atoms
  • Contracts
  • Energy
  • Equations
  • Evaporation
  • Field Emission
  • Field Ion Microscopy
  • Heat Of Activation
  • High Voltage
  • Measurement
  • Metals
  • Microscopes
  • Microscopy
  • Noble Gases
  • Tungsten

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Plasma Physics / Magnetohydrodynamics
  • Thin Film Deposition Science.