CONVOLUTION ANALYSIS OF ELECTRON IMPACT EXPERIMENTS,

Abstract

Electron impact experiments are analyzed from the standpoint of the influence of the electron beam energy distribution on the measurements. A generalized electron energy distribution function is formulated. Special cases of this distribution function yield analytical representations of operational electron guns. The energy distribution of the gun is found to strongly affect the salient features of the cross section. A procedure is thence developed for unfolding the true cross section from impact measurements by removing the distortion of the electron beam. Comparisons with measured data are presented. The response function for a simple retarded gun is derived. The unfolding equation is found to be a first order differential equation. This is in strong contrast to the simple accelerated electron gun which gives an algebraic equation for the unfolding equation. The stability of the integration, with respect to errors in the initial value, is evaluated. The solution is found to be exponentially unstable when forward integration is used, and exponentially stable when backward integration is used. An important practical consequence of the backward integration stability is that it permits estimating the initial value of the true cross section with the folded cross section. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1970
Accession Number
AD0710407

Entities

People

  • Howard Myers
  • Ronald L. Cowperthwaite

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Contrast
  • Convolution
  • Differential Equations
  • Distortion
  • Distribution Functions
  • Electron Beams
  • Electron Energy
  • Electron Guns
  • Electrons
  • Energy
  • Equations
  • Measurement

Fields of Study

  • Physics

Readers

  • Calculus or Mathematical Analysis
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Plasma Physics / Magnetohydrodynamics

Technology Areas

  • Directed Energy
  • Microelectronics