PHASE MATCHED CRITICAL TOTAL REFLECTION AND THE GOOS-HAENCHEN SHIFT IN SECOND HARMONIC GENERATION.

Abstract

It is well established that a totally reflected light beam of finite diameter undergoes a lateral displacement, known as the Goos-Haenchen shift. The theory for the corresponding effect in nonlinear optics is presented. The special phase-matched case, in which both the fundamental and second harmonic are at critical total reflection, is shown to have a characteristic radiation pattern. Since the finite beam diameter is taken into account, divergencies of earlier theories are eliminated. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1970
Accession Number
AD0710772

Entities

People

  • H. Shih
  • Nicolaas Bloembergen

Organizations

  • Harvard University

Tags

DTIC Thesaurus Topics

  • Demographic Cohorts
  • Diameters
  • Displacement
  • Nonlinear Optics
  • Optics
  • Physics
  • Radiation
  • Radiation Patterns
  • Reflection
  • Second Harmonic Generation

Fields of Study

  • Physics

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Control Systems Engineering.
  • Optical Physics and Photonics.