STUDIES OF THIN FILM HARD SUPERCONDUCTORS.

Abstract

Superconducting thin nitride films have been prepared by reactive sputtering. The films have very high superconducting T sub c's and excellent (J sub C)-H characteristics. The superconducting properties and the electrical resistivities of these films were studied as a function of sputtering parameters such as nitrogen partial pressure, deposition rate, substrate temperature and substrate materials. The properties of the films were then related to the structure of the films by electron microscopy studies. The effects of annealing the films were studied. Electrical resistivities and the temperature coefficient of the resistivities were determined. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1970
Accession Number
AD0710960

Entities

People

  • Louis E. Toth
  • Y. M. Shy

Organizations

  • University of Minnesota

Tags

DTIC Thesaurus Topics

  • Annealing
  • Coefficients
  • Electron Microscopy
  • Electrons
  • Films
  • Materials
  • Microscopy
  • Nitrogen
  • Partial Pressure
  • Sputtering
  • Substrates
  • Superconductors
  • Temperature Coefficients
  • Thin Films

Fields of Study

  • Physics

Readers

  • Molecular Photonics/Laser Physics
  • Superconducting Magnet Technology
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene