FINDING A SINGLE DEFECTIVE IN BINOMIAL GROUP-TESTING.

Abstract

The problem of finding a single defective item from an infinite binomial population is considered when the group-testing is possible, i.e., when one can test any number of units x simultaneously and find if all x are good or if at least 1 of the x defective is present. An optimal procedure is obtained in the sense that it minimizes the expected number of tests required to find one defective. Upper and lower bounds are derived using information theory. The relation of the procedure to the Huffman algorithm and the corresponding cost is studied. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1970
Accession Number
AD0712759

Entities

People

  • Milton Sobel
  • Satindar Kumar

Organizations

  • Stanford University

Tags

DTIC Thesaurus Topics

  • Algorithms
  • Binomials
  • Electrical Engineering
  • Information Theory
  • Mathematics

Fields of Study

  • Mathematics

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Statistical inference.