STRUCTURE, PROPERTIES AND RADIATION SENSITIVITY OF ELECTRICALLY BISTABLE MATERIALS

Abstract

The report describes work carried out during the first six-month period on a project directed towards a thorough electrical and metallurgical characterization of selected amorphous semiconducting materials. Equipment for bulk glass preparation has been set up and some thin film structures have been fabricated by flash evaporation techniques. Work has commenced on local order structural measurements and electrical characterization of binary germanium tellurium alloys. It is intended that this study will be extended into more complicated systems as the project continues. Work has commenced on systems based on the vanadium, phosphorus and potassium oxides, and a new crystalline phase has been discovered within this system. A comparative study of the electronic properties of crystalline materials and glasses having the same composition is being carried out. Finally, degradation of thin film electrodes has been observed under certain conditions and is being investigated.

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Document Details

Document Type
Technical Report
Publication Date
Aug 06, 1970
Accession Number
AD0713483

Entities

People

  • Derek B. Dove
  • Larry L. Hench
  • Robert W. Gould

Organizations

  • University of Florida

Tags

DTIC Thesaurus Topics

  • Diffraction
  • Electrodes
  • Electron Diffraction
  • Electron Microscopes
  • Electron Microscopy
  • Engineering
  • Films
  • Frequency
  • Glass
  • Materials
  • Materials Engineering
  • Measurement
  • Microscopes
  • Microscopy
  • Radiation
  • Thin Films
  • X Rays

Fields of Study

  • Materials science

Readers

  • Clinical Trial Research.
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene