BONDING AND CHEMICAL COMBINATION STUDIES USING THE ELECTRON MICROBEAM PROBE.

Abstract

The changes in x-ray emission spectra due to chemical combination may be used effectively with the electron microbeam probe to quickly identify compounds and alloy phases. To lessen the tedium of measuring small spectral changes and to improve precision, step scanning, and automatic data acquisition and handling techniques are used. Such a system is described and computer plotted spectra from hypervelocity impact specimens, oxidation specimens, and thin films are shown. Difficulties and limitations of the technique are discussed, such as carbon contamination and the changes in some spectra due to electron beam penetration changes which influence self-absorption. The self-absorption phenomenon may be taken advantage of, however, and it is shown that the computer can prepare self-absorption plots which closely approximate true absorption spectra. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1970
Accession Number
AD0713711

Entities

People

  • James S. Solomon
  • William L. Baun

Organizations

  • University of Dayton Research Institute

Tags

DTIC Thesaurus Topics

  • Absorption
  • Absorption Spectra
  • Acquisition
  • Analytical Chemistry
  • Chemistry
  • Computers
  • Data Acquisition
  • Electron Beams
  • Electrons
  • Emission Spectra
  • Hypervelocity Impact
  • Microbeams
  • Spectra
  • Spectroscopy
  • Thin Films
  • X Rays

Readers

  • Molecular Photonics/Laser Physics
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Hypersonics
  • Microelectronics
  • Microelectronics - Graphene