Quantitative Texture Analysis by X-Ray Diffraction

Abstract

Techniques have been developed to quantitatively plot pole figures using x-ray diffraction. Corrections are made for background and defocusing effects and the data is converted from angular coordinates to orthogonal coordinates using stereographic mapping equations. The x-ray data is taken using a modified Siemens Pole Figure Goniometer and plotting is done via CDC 6600 and SC 4020 processing. Calculation of an anisotropy index (K sub A) is made from the basal plane pole figures of titanium and empirically related to mechanical properties.

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Document Details

Document Type
Technical Report
Publication Date
Sep 24, 1970
Accession Number
AD0713985

Entities

People

  • R. H. Olsen

Organizations

  • Boeing Commercial Airplanes

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Computer Programming
  • Computer Programs
  • Computers
  • Counters
  • Crystal Structure
  • Crystals
  • Detectors
  • Diffraction
  • Digital Data
  • Materials
  • Mechanical Properties
  • Orientation (Direction)
  • Quadrants
  • Sampling
  • Titanium
  • X Rays
  • X-Ray Diffraction

Readers

  • Computer Science.
  • Control Systems Engineering.
  • Thin Film Deposition Science.