Effect of Irradiation with a High-Power Electron Beam on the Structure and Microhardness of a Silicon Single Crystal,

Abstract

Irradiation of (110) plane of an n-Si single crystal with an electron beam of about 10 (superscript 7) W/cm (superscript 2) resulted in 3 types of deformation. The dislocation d. (Rho) in the 2nd and 3rd regions was about 10 (superscript 7) and is greater than 10, superscript 8/cm (superscript 2). The single-crystal state did not change in any of the 3 regions. The microhardness H (subscript v) changed sharply on annealing at 300 degrees. Annealing at 600 degrees removed all strain, but H (subscript v) did not increase above 1000 kg/mm (superscript 2). The increase of Rho of different specimens is assocd. with the decrease in H (subscript v). (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 27, 1970
Accession Number
AD0714742

Entities

People

  • I. V. Gridneva
  • O. V. Gusev
  • V. I. Trefilov
  • V. P. Alekhin
  • Yu. V. Milman

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Annealing
  • Crystals
  • Dislocations
  • Electron Beams
  • Electrons
  • Microhardness
  • Single Crystals

Fields of Study

  • Physics

Readers

  • Analytical Mechanics
  • Powder metallurgy of Titanium alloys.
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene