Basic Phenomenological Theory of the Optical Properties of Thin Films (Osnovy Fenomenologicheskoi Teorii Opticheskikh Svoistv Tonkikh Pokrytii),

Abstract

The optical properties of thin films used in interferometry are examined from the viewpoint of phenomenological theory to assist in revealing the nature of the basic optical properties of thin films and in preparing the groundwork for determination of the causes of the numberous anomalies inherent to them. The content of phenomenological theory is calculation of the phase path of a wave propagating within a layer and conditions of reflection on its boundaries. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 21, 1970
Accession Number
AD0714831

Entities

People

  • G. V. Rozenberg

Organizations

  • United States Army Foreign Science and Technology Center

Tags

DTIC Thesaurus Topics

  • Boundaries
  • Films
  • Interferometry
  • Optical Properties
  • Physical Properties
  • Reflection
  • Surface Properties
  • Thin Films

Fields of Study

  • Physics

Readers

  • Information Retrieval
  • Theoretical Analysis.
  • Thin Film Deposition Science.