Reliability Evaluation of Discrete Logic Circuits by Their Structure,

Abstract

The engineering method of calculating and evaluating the reliability of discrete logic circuits is outlined. This method includes generalized characterization of individual failures and breakdowns in circuits of standard logical units. It is stated that the reliability of a system as a whole is determined by a formula for the probability of infallible functioning of its separate elements. It is concluded that, in essence, once the probability of infallibility is determined for the circuit, the reliability of the discrete logic circuit can then be easily calculated. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 20, 1970
Accession Number
AD0714872

Entities

People

  • N. S. Shcherbakov

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Circuit Analysis
  • Circuits
  • Electrical Engineering
  • Engineering
  • Logic
  • Logic Gates
  • Performance (Engineering)
  • Probability
  • Reliability
  • Standards
  • Test And Evaluation

Fields of Study

  • Engineering

Readers

  • Computational Modeling and Simulation
  • Educational Psychology
  • Electronics Engineering