Large Scale Integration in Microelectronics.

Abstract

Contents: Evolution of LSI; Comparison of mos and bipolar LSI-technology; Computer aided design in the realisation of large scale integration systems with particular reference to M.O.S.; The impact of LSI (large scale integration) on system packaging; Applications of LSI in airborne computers; Special purpose applications; LSI reliability; Economic considerations in LSI design.

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1970
Accession Number
AD0715143

Entities

Organizations

  • AGARD

Tags

DTIC Thesaurus Topics

  • Airborne
  • Computer Program Reliability
  • Computer Programs
  • Computer-Aided Design
  • Computers
  • Large Scale Integration
  • Microelectronics
  • Packaging
  • Personal Information Managers
  • Reliability

Readers

  • Archaeological Resource Survey
  • Systems Analysis and Design

Technology Areas

  • Microelectronics