Microstructural Characterization of a Proprietary Ceramic Armor.

Abstract

As-polished and polished-and-etched sections of a proprietary ceramic armor material were examined by light microscopy in an effort to characterize the microstructure. Regions representing the bulk of the material and random volumes of low X-ray radiographic density were studied. Silicon, silicon carbide, and boron carbide were identified in the bulk of the material whereas titanium monoboride and silicon triboride, in addition to the aforementioned components, were found in the volume of low radiographic density. All of these components could be differentiated in the unetched condition. It is apparent that liquid silicon reacts with boron carbide to form silicon carbide. The latter tends to be transparent. It is suggested that the presence of titanium in the form of TiB is responsible for the low radiographic density. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1970
Accession Number
AD0715352

Entities

People

  • Mary R. Norton
  • William P. Clancy

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Advanced Materials
  • Armor
  • Boron Carbides
  • Carbides
  • Ceramic Materials
  • Compound Semiconductors
  • Engineered Materials
  • Materials
  • Silicon
  • Silicon Carbide
  • Titanium
  • X Rays

Readers

  • Materials Science and Engineering.
  • Reinforced Composite Materials
  • Thin Film Deposition Science.