Transmission Microscopy of Ion-Bombardment Thinned Boron Carbide.

Abstract

The use of the ion-bombardment etching technique to thin boron carbide ceramics for transmitted light optical and transmission electron microscopy is demonstnated. The results of the transmission electron microscopy provide the first direct evidence of the existence of dislocations in boron carbide. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1970
Accession Number
AD0715857

Entities

People

  • Abram O. King
  • R. Nathan Katz

Organizations

  • United States Army Research Laboratory

Tags

DTIC Thesaurus Topics

  • Boron Carbides
  • Carbides
  • Dislocations
  • Electron Microscopy
  • Electrons
  • Ion Bombardment
  • Microscopy
  • Optical Analysis
  • Transmission Electron Microscopy

Fields of Study

  • Physics

Readers

  • Nanofabrication and Microfabrication.
  • Semiconductor Device Technology
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene