Photodetectors for the 0.1 Micrometer to 1 Micrometer Spectral Region,
Abstract
The state of the art of detectors of electromagnetic radiation in the wavelength region 0.1 micrometer to 1 micrometer is reviewed. The types of detectors considered are photoemissive detectors, semiconductor junction detectors, photoconductors, and photoionization chamber devices. For each type of detector the theory of operation and general material and device properties, including spectral response, frequency response, noise properties, etc., are discussed. The actual properties of presently available, state-of-the-art detectors are summarized. Finally, a comparison of the detectivities possible with the various types of detectors over the 0.1 micrometer to 1 micrometer wavelength range is given. Comparisons of other relevant detector properties (speed of response, reliability) are also included. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 25, 1971
- Accession Number
- AD0718096
Entities
People
- David H. Seib
- Lee W. Aukerman
Organizations
- The Aerospace Corporation