An Analysis of Measurements of Electron Drift Velocity in Silicon at High Fields,
Abstract
An existing computer program is employed to check the validity of an analytic expression used by Tove et al to determine the velocity of electrons as a function of field from time-of-flight current pulses measured in silicon diodes. An alternate analytic expression is introduced for that field range where the velocity is nearly proportional to the square root of the field. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1971
- Accession Number
- AD0720543
Entities
People
- Alford L. Ward
Organizations
- Harry Diamond Laboratories