Epitaxial Vapor Growth of Hg(1-x)Cd(x)Te in an Open Tube Apparatus.

Abstract

The report describes initial experiments made to evaluate optical density measurements as a means of monitoring, and later controlling, concentrations in vapor mixtures. First, closed optical cells containing single vapors were employed. The relationships between charge temperatures, resultant vapor pressures and measured optical densities of the vapors were established. These relationships were then studied under conditions prevailing in an open or free flowing system. This latter is currently used to grow epitaxy films of Hg(x)Cd(1-x)Te. Uniform crystal growth was obtained by means of a balanced-radiation technique for producing a flat temperature profile on the substrate during crystal growth. Precision lattice parameter measurements were used to obtain the value of X percent mole fraction of CdTe in each growth. Both short and long wavelength materials were grown and evaluated. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1971
Accession Number
AD0721390

Entities

People

  • Arthur T. Halpin
  • Donald R. Carpenter
  • Paul B. Pickar

Organizations

  • International Business Machines Corporation (Armonk, NY)

Tags

DTIC Thesaurus Topics

  • Crystal Growth
  • Crystals
  • Fluids
  • Long Wavelengths
  • Materials
  • Measurement
  • Monitoring
  • Precision
  • Pressure Measurement
  • Radiation
  • Substrates
  • Transition Temperature
  • Vapor Pressure

Fields of Study

  • Materials science

Readers

  • Fluid Dynamics.
  • Optical Physics and Photonics.
  • Semiconductor Device Technology