The Determination of the Optical Constants of Amorphous Thin Films of Selenium and Arsenic Triselenide from Infra-Red Reflectivity Spectra.

Abstract

The reflectivity spectra of thin films of amorphous arsenic triselenide and selenium have been obtained. The films are deposited on aluminum substrates and have a range of thickness from 2 to 50 microns. The reflectivity spectra of these samples cover the region from 650 to 40 wavenumbers (15 to 250 microns). (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 30, 1971
Accession Number
AD0723833

Entities

People

  • Chen Yang
  • Gouq-jen Su
  • Jan Bock

Organizations

  • University of Rochester

Tags

DTIC Thesaurus Topics

  • Aluminum
  • Elements
  • Films
  • Physical Properties
  • Reflectivity
  • Selenium
  • Spectra
  • Substrates
  • Thickness
  • Thin Films

Readers

  • Materials Science and Engineering.
  • Nanofabrication and Microfabrication.
  • Spectroscopy.