Aspen International Conference on Fourier Spectroscopy, 1970

Abstract

The report constitutes the proceedings of the Aspen International Conference on Fourier Spectroscopy. The tutorial lectures, which are also included in the proceedings, were intended to bring the participants to the point where the invited and contributed papers would be beneficial to all. These lectures began with a mathematical introduction and with a comprehensive outline of the technique of Fourier spectroscopy. The following specific topics were treated in more detail: signal-to-noise considerations, interferometers for Fourier spectroscopy, double-beaming techniques, refractometry, data handling and processing, and finally a speculative digression on the impact new developments in sources and detectors might have on Fourier spectroscopy. The invited and contributed papers ran the gamut of high and low resolving power instrumentation and results; from resolutions of tens of wavenumbers to thousandths of wavenumbers. The topics covered included new instrumentation, new data handling and analysis techniques, advantages of Fourier techniques as demonstrated by recent results, theoretical considerations on general problems associated with the technique, and applications of the technique under adverse conditions. Finally, it was decided to accept papers on multiplex techniques other than Fourier and/or interferometric. These papers were presented in the last session of the meeting and are also included in this volume.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 05, 1971
Accession Number
AD0724100

Entities

People

  • A. T. Stair Jr.
  • Doran J. Baker
  • George A. Vanasse

Organizations

  • Air Force Cambridge Research Laboratories

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Sensors
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Chemical Synthesis
  • Chemistry
  • Computational Science
  • Crystal Structure
  • Distortion
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Measurement
  • Optical Materials
  • Optical Properties
  • Optics
  • Physics Laboratories
  • Refraction
  • Scattering
  • Spectroscopy
  • Telemetry Equipment

Readers

  • Academic Conference Management
  • Image Processing and Computer Vision.
  • Systems Analysis and Design