Computer Program for Determining Optical Constants of a Film on an Opaque Substrate

Abstract

A computer program is described that determines the optical constants of silver sulfide tarnish films on an opaque silver substrate. The program uses data from normal incidence reflectance measurements taken on two films of different thickness on silver. The sulfide film thickness were measured ellipsometrically.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1969
Accession Number
AD0726868

Entities

People

  • Jean M. Bennett
  • Maxine J. Booty

Organizations

  • Naval Air Weapons Station China Lake

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Acquisition
  • California
  • Computer Programs
  • Computers
  • Detection
  • Detectors
  • Films
  • Materials
  • Measurement
  • Optics
  • Reflectance
  • Security
  • Substrates
  • Target Acquisition
  • Thickness
  • Thin Films
  • Ultraviolet Detection

Fields of Study

  • Physics

Readers

  • Thin Film Deposition Science.