Conference Proceedings: Component Degradation from Transient Inputs, 28-29 April 1970.

Abstract

The proceedings of the conference on 'Component Degradation From Transient Inputs' is presented. The papers given cover the effects of induced electrical transients, as produced by an Electromagnetic Pulse on electronic components. Attention focused on electrical stress degradation and damage on semiconductors. Topics such as thermal damage models, Multiple damage mechanisms, effects of complex waveshapes, synergistic effects, effects on integrated circuitry, and the statistics involved in the characterization of failure are discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1971
Accession Number
AD0726923

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Data Science
  • Degradation
  • Electromagnetic Pulses
  • Electronic Components
  • Electronics
  • Information Science
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Semiconductors
  • Silicon Carbide
  • Solid State Electronics
  • Statistics

Fields of Study

  • Engineering

Readers

  • Academic Conference Management
  • Electrical Engineering
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics