Conduction Mechanisms in Thick Film Microcircuits

Abstract

Specifications were developed to define good resistors and conductors for the project. The design and performance of a laboratory scale three roll dispersing mill is described. The contact resistance between two single crystals of RuO2 in the presence of glass was measured as a function of temperature and thermal history. After formation of a stable contact during the first firing, the contact resistance was observed to be large compared to the crystal resistance, to have a lower TCR, and to increase with repeated firings; models are proposed to explain these results. The coefficient of linear thermal expansion was measured for alloys in the Ag-Pd and Au-Pt systems; the results were correlated with the respective phase diagrams.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1971
Accession Number
AD0727988

Entities

People

  • R. W. Vest

Organizations

  • Purdue Research Foundation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Alloys
  • Dispersions
  • Electric Charge
  • Electrical Engineering
  • Electrical Properties
  • Film Resistors
  • Films
  • Materials
  • Materials Science
  • Measurement
  • Mechanical Working
  • Palladium Alloys
  • Phase Diagrams
  • Softening Point
  • Solid Solutions
  • Thick Films

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.
  • Tribology (the study of the boundary interaction between sliding surfaces, lubrication, wear and friction).

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene