Analytical Techniques for the Determination of Trace Impurities in II-VI Compounds.
Abstract
Analyses of II-VI compounds were performed using spark source mass spectrometer techniques. Of a total of 193 samples, 153 were analyzed using photographic techniques and 40 using electronic methods. The compounds of primary interest were CdS, CdSe, ZnS, and ZnSe. Detection limits were on the order of 1 to 10 parts per million. A technique was developed for determining oxygen in cadmium sulfide. Oxygen was found in concentrations of a few parts per million. Studies were made involving platinum as a probe material. The effects of using 24 kV accelerating voltage as compared with 16 kV were also investigated. A new technique was developed for the analysis of sulfur. Detection limits of <0.1 parts per million were obtained. A new type of mass spectrometer was used for the first time to investigate the distribution of impurities in cadmium sulfide. The instrument, called the Ion Microanalyzer has the capability of analyzing surfaces by sputtering away successive monolayers of material with a beam of ionized gas. Ion images, and mass spectra were obtained for samples of sodium- and copper-doped cadmium sulfide. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1970
- Accession Number
- AD0728219
Entities
People
- Arthur J. Socha
- Eleanor M. Masumoto
- Robert K. Willardson