Goodness of Fit Tests for the Gamma and Exponential Distributions.

Abstract

Goodness of fit tests based on generalized minimum Chi square are developed for the gamma and exponential distributions. The power of these tests has been found for several alternative families of distributions by utilizing the asymptotic non-null distribution of the test statistics. The tests behave very well for the types of alternatives considered here. Applications to some failure data of Proschan (1963) are included for illustrative purposes. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1971
Accession Number
AD0728458

Entities

People

  • John Gurland
  • Ram C. Dahiya

Organizations

  • University of Wisconsin–Madison

Tags

DTIC Thesaurus Topics

  • Computing-Related Activities
  • Data Science
  • Goodness Of Fit Tests
  • Information Science
  • Interdisciplinary Science
  • Mathematics
  • Statistical Analysis
  • Statistics

Fields of Study

  • Mathematics

Readers

  • Statistical inference.