The Application of Integrated Circuits to Electronic Measurement,

Abstract

The design for a High-Q Tunable Active Filter was incorporated into a Time Delay Measuring Device which was constructed to measure the time difference in a wave front incident with the array. In addition to the High-Q Tunable Active Filter, the Time Delay Measuring Device included also a Variable Time Delay, and an Analog Summing Amplifier both of which were used in the design of nulling circuits. Integrated circuit operational amplifiers were used throughout the design of the Time Delay Measuring Device. The advantages gained in performance, cost, reliability, and size reduction over the use of discrete components was clearly demonstrated. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 18, 1971
Accession Number
AD0728764

Entities

People

  • William A. Emslie

Organizations

  • United States Naval Academy

Tags

DTIC Thesaurus Topics

  • Amplifiers
  • Circuits
  • Integrated Circuits
  • Measurement
  • Operational Amplifiers
  • Reliability

Fields of Study

  • Engineering

Readers

  • Optical Physics and Photonics.
  • Phased Array Antenna Design.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems