Structure, Properties and Radiation Sensitivity of Electrically Bistable Materials

Abstract

This semiannual report contains copies of papers to be published in the proceedings of the Fourth Internationl Conference on Amorphous and Liquid Semiconductors. The first reports measurements on the thermal properties of germanium selenides using differential thermal analysis; the second describes changes in local atomic order in thin films of composition GeTe2 produced by deposition conditions and heat treatment; the third paper summarizes work on the effect of microstructure on the radiation sensitivity of semiconducting glasses. Also included is a discussion of the structure of amorphous Ge(x)Se(1-x) films and their response to heat treatment.

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Document Details

Document Type
Technical Report
Publication Date
Sep 06, 1971
Accession Number
AD0731298

Entities

People

  • Derek B. Dove
  • Larry L. Hench
  • Robert W. Gould
  • Ronald E. Loehman

Organizations

  • University of Florida

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amorphous Materials
  • Crystal Structure
  • Crystals
  • Diagrams
  • Diffraction
  • Electron Microscopes
  • Electrons
  • Engineering
  • Heat Treatment
  • Materials
  • Materials Engineering
  • Materials Science
  • Microscopes
  • Optical Materials
  • Phase Diagrams
  • Radiation
  • Scattering

Fields of Study

  • Materials science

Readers

  • Optical Physics and Photonics.
  • Solar Photovoltaics and Thermoelectric Devices.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene