Predicted and Measured Depth Dose Profiles for Pulsed Electron Spectra,
Abstract
Experimentally measured depth dose profiles for several materials are compared with the theoretical profiles calculated by the electron transport computer code ZEBRA. The experimental profiles were obtained using a new technique. The samples of the materials were exposed to the pulsed electron beam from the flash x-ray machine at HDL. The surface motion induced by the exposure was measured with a laser interferometer. These measured responses were converted to velocity histories that can be related to the depth dose profiles. The depth dose profiles of nine materials with atomic numbers ranging from 13 to 79 were obtained. For three of these materials, profiles were obtained for more than one electron spectrum. In general, the measured and calculated profiles agree with each other well enough to demonstrate the applicability of this experimental technique to a wide range of materials and electron spectra. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1971
- Accession Number
- AD0731778
Entities
People
- Dale R. Schallhorn
- Lawrence D. Buxton
Organizations
- Harry Diamond Laboratories