Reliability Physics Study of Microwave Solid State Devices.
Abstract
The report covers the second half of a year-long study of the reliability physics of Gunn, LSA, and IMPATT devices. The major topics of discussion are thermal transport, failure mechanisms, and the results of life tests on Gunn, LSA, and IMPATT devices. Finally, an attempt is made to draw conclusions from these studies and to establish some acceptance criteria which should insure reliable performance of the bulk microwave devices. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1971
- Accession Number
- AD0731794
Entities
People
- Ronald H. Cox.
- Truman G. Blocker
- Turner E. Hasty
- William R. Wisseman
Organizations
- Texas Instruments