Transmission Electron Microscopy Investigations of Fatigued Copper Single Crystals: Experimental Aspects.

Abstract

Dislocation configurations in slices of material taken ahead of the fatigue crack tip in copper single crystals were observed through transmission electron microscopy. These observations revealed: (a) a distinct transition in configuration as a region within approximately 250 microns of the crack tip was approached and (b) a reduction in dislocation cell size with decreasing distance from the crack tip similar in form to cell-size-vs-fatigue-stress-increase curves. These observations lend support to the concept of a distinct 'plastic zone' in the vicinity of the fatigue crack tip, with associated blunting-type crack propagation mechanisms. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1971
Accession Number
AD0732016

Entities

People

  • Arthur H. Purcell
  • Johannes Weertman

Organizations

  • Northwestern University

Tags

DTIC Thesaurus Topics

  • Cell Size
  • Crack Propagation
  • Crack Tips
  • Cracks
  • Crystals
  • Dislocations
  • Electron Microscopy
  • Electrons
  • Materials
  • Microscopy
  • Observation
  • Single Crystals
  • Transmission Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Materials Science (Mechanical Engineering).
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics