A Proposed Mathematical Model for Predicting Military Electronic Equipment Component Failure Rates and Isolating Underlying Failure Causes

Abstract

A mathematical expression for combining the entire failure rate curve is derived based on the assumption that the failure population is composed of three subpopulations, early, chance, and wearout. A graphical method is provided for separating the subpopulations and determining the parameters of the model. The expression is then applied to observed failure data in three detailed examples and in each case the model is shown to represent the observed data at the .05 significance level using the Kolmogorov-Smirnov Test. Two BASIC language computer programs are provided to simplify the use of the proposed model.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1970
Accession Number
AD0733389

Entities

People

  • Raymond E. Starsman

Organizations

  • United States Army Command and General Staff College

Tags

Communities of Interest

  • Air Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Computer Programs
  • Computers
  • Electron Tubes
  • Electronic Equipment
  • Failure Mode And Effect Analysis
  • Goodness Of Fit Tests
  • Life Tests
  • Mathematical Models
  • Models
  • Normal Distribution
  • Probability
  • Probability Density Functions
  • Quality Control
  • Reliability
  • Statistical Distributions
  • Visual Inspection

Fields of Study

  • Engineering

Readers

  • Computational Modeling and Simulation
  • Mental Health of Military Veterans with Posttraumatic Stress Disorder (PTSD): Risk Factors, Prevalence, Symptoms, and Treatment.
  • Statistical inference.

Technology Areas

  • Microelectronics