Research in the Field of Memories Operating on the Basis of Thin Magnetic Layers,
Abstract
The Research Institute for the Communication Technological Industry investigated the technology and structure of thin magnetic layer memories for nearly five years. Data on the vapor deposited plane memories and wire memories were presented. Electron micrographs were presented of a 80/20 Ni, Fe layer (15,000 times magnification), a 60/40 Ni, Fe layer (15,000), and a pure Fe layer (15,000). The instrument devised for establishing the hysteresis characteristics, and some hysteresis diagrams for a 81/91 Ni, Fe layer were shown. The wire memories were found to have a number of advantages over the plane memories, but they are more heat sensitive. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 26, 1971
- Accession Number
- AD0734903
Entities
People
- Janos Katona
Organizations
- National Air and Space Intelligence Center