Optical and Electrical Properties of Amorphous Elemental Semiconductors
Abstract
The cryostat for in situ investigation of the optical and electrical properties of amorphous materials has been built and preliminary tests are now being made. This coupled with an ion pump vacuum system is expected to provide much needed information on the intrinsic nature of amorphous materials evaporated under controlled conditions. An optical system for measuring the incident, transmitted, and reflected beam is also completed and tested. Work on the optical and electrical properties of amorphous silicon have been continued with improved precision.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 31, 1971
- Accession Number
- AD0736508
Entities
People
- Robert Glosser
- Rolfe E. Glover Iii
Organizations
- University of Maryland