Evaluation of the Resistance of Digital Computers to Malfunctions,

Abstract

Several methods of evaluating the program resistance of electronic computers to short-term malfunctions during reliability tests are analyzed. Criteria are presented allowing quantitative analysis of the stability, resistance, and reliability of operation of the digital computer to be evaluated, taking into account the availability of means for instrument and programmed monitoring. A method is suggested for performing tests and processing the results.

Document Details

Document Type
Technical Report
Publication Date
Nov 10, 1971
Accession Number
AD0736512

Entities

People

  • K. K. Kolin
  • P. G. Gaganov

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Availability
  • Computers
  • Digital Computers
  • Malfunctions
  • Monitoring
  • Reliability
  • Resistance
  • Test And Evaluation

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Software Engineering
  • Theoretical Analysis.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems