Studies, Research and Investigations of the Optical Properties of Thin Films of Metals, Semi-Conductors and Dielectrics

Abstract

A problem experienced for some years in this work has been the precision measurement of the reflectance of a thin film sample. The report discusses the design and alignment of a reflectometer to be used in the research.

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Document Details

Document Type
Technical Report
Publication Date
Feb 16, 1969
Accession Number
AD0737287

Entities

People

  • Lawrence N. Hadley

Organizations

  • Colorado State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Angle Of Incidence
  • Detectors
  • Electron Tubes
  • Films
  • Hot Water
  • Indicating Instruments
  • Light Sources
  • Measurement
  • Monochromators
  • Night Vision
  • Optical Properties
  • Physics
  • Precision
  • Reflectance
  • Rotation
  • Thin Films

Fields of Study

  • Physics

Readers

  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Systems Analysis and Design
  • Thin Film Deposition Science.