Conduction Mechanisms in Thick Film Microcircuits

Abstract

The specific objectives of the program are: (1) Determine the dominant sintering mechanisms responsible for microstructure development, and establish the relative importance of the various properties of the ingredient materials. (2) Determine the dominant mechanisms limiting electrical charge transport, and establish the relative importance of the various properties of the ingredient materials. (3) Develop phenomological models to inter-relate the various material properties with system performance. A proposed model to satisfy objective 1 is presented in this report, and an experimental program is being developed to test the various aspects of the model.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1972
Accession Number
AD0737382

Entities

People

  • R. W. Vest

Organizations

  • Purdue Research Foundation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Human Systems
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Composite Materials
  • Diffusion Coefficient
  • Electric Charge
  • Electrical Engineering
  • Electrical Properties
  • Equations
  • Ethyl Cellulose
  • Film Resistors
  • Films
  • Geometry
  • Materials
  • Materials Science
  • Measurement
  • Particle Size
  • Scattering
  • Thick Films

Readers

  • Rocket Propulsion.
  • Theoretical Analysis.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics