Accelerated Life Testing of Thick Film Resistors

Abstract

The aim of the work was to investigate the possibility of correlating an accelerated stress test to a conventional life test for thick film resistors. The material chosen for the study was Alloys Series A, R12, R13, and R54. Results are discussed.

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1971
Accession Number
AD0738269

Entities

People

  • P. L. Shove

Organizations

  • Admiralty Surface Weapons Establishment

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Electrical Loads
  • Electrical Resistance
  • Failure Analysis
  • Failure Mode And Effect Analysis
  • Film Resistors
  • Films
  • Heat Of Activation
  • Life Tests
  • Materials
  • Measurement
  • Resistance
  • Resistors
  • Static Electricity
  • Stress Tests
  • Test And Evaluation
  • Test Methods
  • Thick Films

Fields of Study

  • Engineering

Readers

  • Battery Technology and Engineering
  • Thin Film Deposition Science.