Operation of Reliability Analysis Center.
Abstract
The Reliability Analysis Center is a service for the dissemination of reliability test and experience information on microcircuit devices. This report summarizes accomplishments of the Center during its third full year of operation, covering the period from 1 September 1970 through 30 September 1971. Information is presented on the output products and services, input data acquisitions, and the internal information processing functions. In addition, subscriber status and individual publication sales are documented. The various methods for publicizing RAC services and current efforts directed toward expansion of these services to effect greater utilization of accumulated data resources are discussed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1972
- Accession Number
- AD0738649
Entities
People
- Barbara Petersen
- Harold Lauffenburger
- Hugh Edfors
Organizations
- IIT Research Institute