Photoemission Properties of Aluminum Oxide and Evaporated Aluminum Films,
Abstract
Measurements of the photoemission energy distributions and quantum yield for anodically grown aluminum oxide are presented. At photon energies greater than 25 eV, the emitted spectrum consists mostly of inelastically scattered electrons. Also measured is the yield dependence on the angle of incidence. Measurements of the energy distributions from evaporated aluminum films show a significant number of primary electrons (relative to the secondaries). However, evidence suggests that the evaporated film was contaminated either by the oxide of the substrate or from oxygen in the existing vacuum. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1972
- Accession Number
- AD0739198
Entities
People
- Richard Y. Koyama
Organizations
- National Institute of Standards and Technology