Plotting Isothermal Diagrams by an X-Ray Diffraction Method,

Abstract

A vacuum device for high temperature X-ray diffraction analysis is described (heating by A.C., sample heating velocity 100 degrees-sec., sample cooling rate 20 degrees-sec within 600-700 degrees, temperature changes of several degrees during the measurement, given residual pressure at 1000 degrees achieved within 1-1.5 hr., angular velocity one fourth-30 degrees-min., CsJ(Tl) crystal of a thickness of 0.8 mm, input 4kVA). Device parameters enable the plotting of isothermal diagrams of low alloyed Ti alloys. Isothermal diagrams of Ti4Al6Cr alloy and diagrams of isothermal decomposition of the metastable beta phase in Ti12V3Al, Ti6V4Al, Ti10V4Al, and Ti12V3Al alloys are given. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 11, 1971
Accession Number
AD0739219

Entities

People

  • L. S. Moroz
  • V. V. Obukhovskii

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Beta Testing
  • Climate Change
  • Diagrams
  • Diffraction
  • Diffraction Analysis
  • High Temperature
  • Measurement
  • Phase
  • Phase Diagrams
  • Plotting
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science
  • Physics

Readers

  • Astronomy/Astrophysics
  • Powder metallurgy of Titanium alloys.