Tests of Plastic Encapsulated Semiconductors.

Abstract

The paper evaluates test data of plastic encapsulated semiconductors from four manufacturers and three different supply sources tested under high humidity and high temperature in a test chamber in a laboratory and under field conditions in Panama. The complete block design is used to perform the statistical analyses of the test results. Suggestions are given for improving the test herein reported on and also for establishing a proposed test program. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1971
Accession Number
AD0739473

Entities

People

  • Siegfried R. Fick

Organizations

  • United States Army Materiel Command

Tags

DTIC Thesaurus Topics

  • Buildings And Structures
  • Compound Semiconductors
  • Electronics
  • Field Conditions
  • High Humidity
  • High Temperature
  • Humidity
  • Research Facilities
  • Semiconductors
  • Solid State Electronics
  • Statistical Analysis
  • Wet Bulb Temperature

Readers

  • Internal Combustion Engine (ICE) Technology.
  • Regression Analysis.
  • Solar Photovoltaics and Thermoelectric Devices.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems