Structure, Properties and Radiation Sensitivity of Electrically Bistable Materials
Abstract
The second annual report describes work carried out on the structural and electrical characterization of chalcogenide glasses. Electron diffraction radial distribution studies have been completed in the As(2)Te(3-x)Se(x) system and the thermal stability of these glasses in the presence of metallic surface layers has been examined. X-ray measurements on the kinetics of crystallization of bulk GeSe(x) glasses have been continued and diffuse scattering data have been obtained on a number of Ge-Se-As bulk glasses. Glass transition and crystallization temperatures have been observed by differential scanning calorimetry, a technique of high sensitivity. A comparison is made between the a.c. conductivity of glasses measured with planar and sandwich electrode configurations. A simple technique employing the decomposition of molybdenum carbonyl is described for the rapid deposition of thick refractory electrodes of good conductivity.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 06, 1972
- Accession Number
- AD0740379
Entities
People
- Derek B. Dove
- Larry L. Hench
- Robert W. Gould
- Ronald E. Loehman
Organizations
- University of Florida