Physical Characterization of Electronic Materials, Devices and Thin Films
Abstract
Research is directed toward the characterization of specified physical, chemical and structural properties of various materials. Experimental methods include chemical analysis, reflection electron microscopy and diffraction, X-Ray diffraction and flourescence analysis, light microscopy and electron microprobe analysis, in addition to the determination of specific properties, such as density, hardness and thermal conductivity. Special services, such as crystal orientation, cutting, grinding and polishing are also being performed. A variety of specimens have been submitted for specific studies such as phase identification, crystallinity and chemical analysis.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1971
- Accession Number
- AD0740590
Entities
People
- Konstantin Kreder
- S. Andrew Kulin