Wire-Bond Electrical Connections: Testing, Fabrication and Degradation- -A Bibliography 1957-1971

Abstract

More than 245 papers relevant to wire-bond type electrical interconnections used in microelectronic and low-power discrete and hybrid devices are listed together with key words. The bibliographic search concentrated on compiling papers which appeared in the period from 1965 to 1970, inclusive. The selection of papers was generally limited to those that were pertinent to wire-bonds where the wire diameter is less than about 50 micron (2 mils) and where the wire is bonded by either thermocompressive or ultrasonic means. Two indexes are provided: (1) an Author Index and (2) a Key Word Index. The latter includes a tabulation of the literature citations.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1972
Accession Number
AD0740673

Entities

People

  • Harry A. Schafft

Organizations

  • National Institute of Standards and Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Chemistry
  • Degradation
  • Electronic Components
  • Engineers
  • Failure Mode And Effect Analysis
  • Geography
  • Integrated Circuits
  • Manufacturing
  • Materials
  • Materials Science
  • Materials Testing
  • Measurement
  • Mechanics
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation
  • Test Methods

Readers

  • Integrated Circuit Design and Technology.
  • Library and Information Science

Technology Areas

  • Microelectronics