Band Structure and Electrical Properties of Amorphous Semiconductors
Abstract
Threshold switching in thin-film devices; Crystalline and amorphous silicon-tellurium alloys; Theoretical studies of amorphous semiconductors; EPR measurements on amorphous solids.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 31, 1971
- Accession Number
- AD0740838
Entities
People
- David Adler
Organizations
- Massachusetts Institute of Technology