Characterization of Particulate Ceramic Materials by Computerized Scanning Electron Microscope Techniques

Abstract

Techniques have been developed for the quantitative characterization of particulate materials by computer evaluation of scanning electron microscope images (CESEMI). The full CESEMI analysis is particularily applicable to particles in the size range of 0.1 to 100 micrometers diameter. It measures, particle-by-particle, the following basic parameters: Project areas; Perimeter; Major axis of fitted ellipse; Minor axis of fitted ellipse; Orientation of major axis; and Particle type as deduced from characteristic x-ray signals for the elements. The technique is not described in detail here. On the other hand, the simple image analysis procedures have been only recently developed and are described in detail.

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Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1972
Accession Number
AD0740863

Entities

People

  • E. W. White
  • G. G. Johnson
  • H. A. Mckinstry

Organizations

  • Pennsylvania State University

Tags

Communities of Interest

  • Human Systems

DTIC Thesaurus Topics

  • Analyzers
  • Aspect Ratio
  • Circuits
  • Computers
  • Diagrams
  • Distribution Curves
  • Electron Microscopes
  • Instrumentation
  • Materials
  • Materials Processing
  • Microscopes
  • Nand Gates
  • Particle Size
  • Particles
  • Petrology
  • Scanning Electron Microscopes
  • X Rays

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Space Exploration and Orbital Mechanics.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene