Operation and Maintenance Manual, Microelectronic Wafer and Integrated Circuit Test Set, TTU-311/E (XV-1).

Abstract

Procedures are given for operation and maintenance of Test Set TTU-311/E. The Test Set is used as an operator aid in the visual inspection of integrated ciruits on the production line. A functional description is first given, followed by operational procedures. System maintenance procedures are then described. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1972
Accession Number
AD0742237

Entities

Organizations

  • RTI International

Tags

DTIC Thesaurus Topics

  • Circuits
  • Inspection
  • Integrated Circuits
  • Maintenance
  • Production
  • Test Sets
  • Visual Inspection

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.
  • Linear Algebra

Technology Areas

  • Microelectronics