Reliability Prediction for Monolithic Integrated Circuits

Abstract

The report presents the results of a study directed toward developing a reliability-prediction technique for monolithic integrated circuits. A prediction model that expresses reliability as a function of device screening, sampling, system burn-in test, and field operate time was developed. The equation is based on data taken from military, space, and commercial application of integrated circuits. The report presents the rationale that led to formation of the equation and describes its use and methods of application.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1971
Accession Number
AD0742847

Entities

People

  • J. Reese

Organizations

  • ARINC

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes
  • Space

DTIC Thesaurus Topics

  • Circuits
  • Computers
  • Data Analysis
  • Data Sets
  • Databases
  • Dead Reckoning
  • Engineering
  • Failure Mode And Effect Analysis
  • Inertial Navigation
  • Integrated Circuits
  • Life Tests
  • Manufacturing
  • Quality Control
  • Regression Analysis
  • Reliability
  • Reliability Engineering
  • Standards

Fields of Study

  • Engineering

Readers

  • Computational Modeling and Simulation
  • Electrical Engineering
  • Semiconductor Device Technology

Technology Areas

  • Space