Applications of Dual Parameter Analyzers in Solid-State Laser Tests.
Abstract
New applications of a 128 by 128 channel, computer-controlled, dual parameter analyzer used to record, compute, and display solid-state laser emission and propagation data are described. The pulse-height-analysis coincidence mode is used to make spike amplitude measurements on reference and propagated signals or make spike coincidence measurements on two spectrometer output signals. An X-Y contour mode display provides a real-time visual indication of results for wavelength-dependent absorption tests, cavity mode tests, and beam cross-section studies. A description of an operating system and initial test results are presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1972
- Accession Number
- AD0743459
Entities
People
- Kenneth O. White
- Stuart A. Schleusener
Organizations
- Atmospheric Sciences Laboratory