A Center of Competence in Solid State Materials and Devices

Abstract

Contents: Photodetection using photomagnetoelectric and Dember effects in gold-doped silicon; Investigation of the recombination and trapping processes of photo-injected carriers in semi-insulating Cr-doped GaAs using PME and PC methods; Low temperature photomagnetoelectric and photoconductive effects in n-type InAs; The effect of a buried layer on the collector breakdown voltages of bipolar junction transistors; Device characterization for computer analysis of large semiconductor circuits; Structural effects on fast neutron radiation sensitivity of semiconducting glasses; Effects of microstructure on the radiation stability of amorphous semiconductors; Electronic materials interfacial characterization program.

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Document Details

Document Type
Technical Report
Publication Date
Oct 10, 1971
Accession Number
AD0743834

Entities

People

  • Arthur J. Brodersen
  • Eugene R. Chenette
  • Fredrik A. Lindholm
  • Larry L. Hench
  • Shengsan Li

Organizations

  • University of Florida

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Bipolar Junction Transistors
  • Computer Programs
  • Computers
  • Crystal Structure
  • Detection
  • Detectors
  • Electrical Properties
  • Electromagnetic Fields
  • Electronics Laboratories
  • Energy Bands
  • Fast Neutrons
  • Fermi Levels
  • Low Temperature
  • Measurement
  • Operating Systems
  • Semiconductors

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics